UT ECE students Bei Yu, Xiaoqing Xu, Jhih-Rong Gao and their advisor Prof.  David Z. Pan received the William J. McCalla Best Paper Award at the 2013 IEEE/ACM International Conference on Computer Aided Design (ICCAD). The title of the paper that received the award is “Methodology for Standard Cell Compliance and Detailed Placement for Triple Patterning Lithography.” The award will be presented at the opening session for ICCAD 2013, on Monday, Nov. 18, 2013. ICCAD is the premier conference devoted to technical innovations in electronic design automation.

ICCAD serves EDA and design professionals, highlighting new challenges and innovative solutions for Integrated Circuit Design Technologies and Systems. ICCAD covers the full range of CAD topics – from device and circuit-level CAD up through system-level CAD and embedded software, as well as CAD for post-CMOS design and novel application areas, such as biology and nanotechnology.