Texas ECE professor Jacob Abraham, has received the IEEE Test Technology Technical Council (TTTC) Lifetime Contribution Medal. The IEEE TTTC Lifetime Contribution Medal is presented to a prominent individual for outstanding technical contributions that have made a fundamental impact on test technology. It is granted periodically by TTTC, and was last awarded in 2013.

Abraham will receive the award at the 2017 IEEE International Test Conference (ITC) in Fort Worth later this month.

Jacob Abraham holds the Cockrell Family Regents Chair in Engineering #8 and is director of the Computer Engineering Research Center. His research interests include VLSI design and test, formal verification, and fault-tolerant computing. He is the principal investigator of several contracts and grants in these areas, and a consultant to industry and government on testing and fault-tolerant computing. He has over 300 publications, and has been included in a list of the most cited researchers in the world. Professor Abraham has also been elected Fellow of the IEEE as well as Fellow of the ACM, and is the recipient of the 2005 IEEE Emanuel R. Piore Award, the 2011 Hocott Distinguished Centennial Engineering Research Award, and the 2017 Jean-Claude Laprie Award in Dependable Computing.